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Shore Durometer Test Stand
UI-FT31
Shore Durometer Test Stand is used to support the durometer presser foot surface parallel to the sample support table to better complete the test.
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HighFfrequency Test Devices
VI Systems now releases engineering prototype samples of high performance transmitter and receiver optical subassemblies (TOSAs and ROSAs) for 25 Gbit/s and 40 Gbit/s applications and product development.
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VFTLP+ Test System
4012
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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MM Fiber Test
KI-TK032
850/1300 nm source & power meter, inspection microscope, cleaning materials. Interchangeable SC & LC connectors
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Fuel Cell Test Accessories
Scribner extends its groundbreaking line of tabletop fuel cell testing equipment with the 885 Fuel Cell Potentiostat.
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Universal High Speed Bench Test Automation Framework
KayaQ™ (GRL-KAYAQ-FW)
GRL’s Universal High Speed Bench Test Automation Framework ‘KayaQ™ ’ is an enterprise-quality, Windows 7 PC-based, ready-to-use automation environment for labs overcoming the next generation challenges of bench testing. The world’s leading provider of high speed interface PVT characterization test services, GRL developed KayaQ™ to address the gaps in available tools for high speed interface characterization. KayaQ™ provides a ready-to-deploy automated test solution for testing of high speed interfaces, tailored for the needs of volume bench-level IC PVT characterization.
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Test Module
MTC
The measuring channels can be connected depending on the application to the pins on the system interface or to the six internal bus lines.Four measuring channels per module on 8:1 multiplexer = 32 InputsUp to 4 parallel measurements per MTC (4 parallel counters)Intelligent algorithms for fast measurements even at low frequenciesFrequency, period, pulse width, rise- and falling time as well as event counting on each channelTime measuring range: 10 ns - 42 s, resolution 10 nsFrequency measuring range: 0.015 - 100 MHzEvent counting: 0 - 232, maximum 100 MHzMax. input level/trigger voltage: +/-100 VSynchronization with external trigger possible
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Electronic Tensile Strength Tester Pull Force Test Chamber Applicable Industri
Shenzhen Chuangxin Instruments Co., Ltd.
This machine can test various materials (both finished and semi-finished products ) of tensile strength ,compressive strength and elongation ,can do stripping ,tear strength ,flexural ,compression test and etc. It can connect up to the computer and display or printout the test times , test value , max. value , etc . Also it can make various report forms according to the requirements .
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USB-C® Tx & Long Chnnel Rx Precet. Test Fixture
AUT20044 Rev:B0
The original Intel USB-C 3.1 Tx Test Fixtures includes two types of fixtures, UFP and DPF. Allion Pre-Cert Test Fixture integrates functions of the two fixtures into an one-board solution, eliminating the hassel to frequent switching of two fixtures.
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0 to 1000 ppm CO Measurement Range
EL-USB-CO
The EL-USB-CO is a USB data logger that measures and stores up to 32,510 Carbon Monoxide (CO) readings over a 0 to 1000 ppm measurement range. The user can easily set up the logging rate and start time, and download the stored data by plugging the module straight into a PC's USB port and running the purpose designed software under Windows 2000, XP or Vista
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Multi-Spectral Test Set
MSTS
The Multi-Spectral Test Set (MSTS™) is a two-color infrared (IR), ultra-violet (UV), and multi-band laser hand-held test set with an integrated detector. The MSTS provides an end-to-end flight line confidence test for directional infrared countermeasure (DIRCM), UV missile warning systems, IR missile warning systems, and multi-band laser warning systems. The MSTS is ruggedized, battery-operated, and can be hand-held or mounted on a tripod.
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Ultra-high Performance Solution for Memory Device Test
Magnum EPIC
Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.
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Aging and Life Test Rack
SY2036
SY2036 Aging and life test rack is fully designed according to the IEC standard, and can also be designed based on the customer request. SY2036 can test LED, CFL, HID Indoor lamp and Outdoor lamp. Input Power supply: AC220V, 50/60HZ, 12KVA Min (110V is option) • Built-in transformer: 0-250V 5KVA and 0-300V 5KVA (Other power is option) • Maximum power for EUT: 5KVA and 12A (Other power is option) • EUT and Number: 112pcs B22, 112pcs E27. 36pcs T5/T8/T12 Tube. 32pcs LED panel (Other EUT can be designed according to customer request) • ON/OFF test: Can be set on the touch screen with program • Test number: 0~99999（Adjustable）
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SM & MM Quad Optical Loss Test Set
KI2724-INGAAS-APC
A SM & MM Quad Optical Loss Test Set used to test power, insertion loss, continuity and faults on multimode and single mode fiber with an APC connector at 850 / 1300 nm & 1310 / 1550 nm. In a small package, it provides a powerful solution to improve test flexibility and productivity.
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Relay Test Set
Widely used in electrical and power sector for testing relays, these equipments are offered to clients in different technical specifications.
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Test Fixtures-Assemblies
Qmax Test Technologies Pvt. Ltd.
Test Clips are available for various types of DIP ICs like 8, 14, 16, 20, 24, 28, 40, 48 & 64. These can be supplied with or without connectors and cables for interfacing to Qmax Testers. Test Pins in the clips are gold plated and engineered for good contact with the Device Under Test. It is designed for long life and trouble free operation. For easy handling the clips are provided with metal covers.
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Generate MC/DC Test
VectorCAST/MCDC™
Modified Condition / Decision Coverage (MC/DC) provides two levels of verification for conditional expressions. The first level, named MC/DC Branches, tracks each subcondition in an expression to verify that is has been tested with both True and False values. The second level, named Equivalence Pairs, verifies if each subcondition can affect the value of the condition. This is done by generating a truth table for the expression, and then finding a pair of rows in the table that will generate a different result when all values except the tested value remain constant.
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HGB and shoe test
ESD protection measures must be performed in a work environment with increased sensitivity for electrostatic charging and discharging.In order to ensure effective protection, as required by EN 61340,Our devices offer you an easy way to check and monitor the wrist straps, dissipative shoes or the whole workplace.
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Visible / Infrared / Imaging Test System
System 1808
Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Scanning Head For Energy Meter Test
PACB108
PACB08 is the accessory device to perform the energy meter test, which can work together with PONOVO’s relay test sets to test energy meter by using Energy Meter Module in Powertest software.
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IEC61032 Test Probe Pin
CX-112
Shenzhen Chuangxin Instruments Co., Ltd.
1. Jointed test finger probe (Figure 2 / Test Probe B / IEC 61032)This is a precision probe made in accordance with all IEC standards. Examples are IEC 61032, 60950, 61010 and 60601; and it is also used for Canadian and USA standards. It features a palm simulator and a restricted joint movement, which simulates the characteristics of the human hand. The finger is made of stainless steel and the rest of the instrument is Delrin®. Handle is designed to accept either a banana jack or a force gauge.It is no longer necessary to have a separate probe for the medical safety standard. This one probe will meet all the different requirements that are in the IEC standards.
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10 MHz To 67 GHz USB Wide Dynamic Range Average Power Sensor
U2057XA
Accurately measure any modulated signal with the Keysight Technologies, Inc. U/L2050/60 X-Series wide dynamic range power sensors. The USB/LAN connectivity models come with a wide dynamic range, covering -70 to +26 dBm. This sensor offers very accurate and repeatable power measurements for any modulated signal and comes with a super-fast measurement speed of 50,000 readings/sec, which enables higher manufacturing throughput. Users can also save time and reduce measurement uncertainty with the in...show more -
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Laser Diode Light Current Voltage (LIV) Test Instruments
The Yelo LIV test instrument allows LIV measurements to be taken from laser devices loaded into a Yelo module. This module can also be used with the Yelo Y1000L Low Power Burn-in system. The LIV test instrument has been designed for easy operation. Once powered on, and with laser supply enabled, the touch screen can be used to initiate, monitor and review measurements of laser devices.
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Digital Incircuit Test
PFL780/760
The PFL780 and 760 use IC clips as a test interface. This makes them ideal for the service and maintenance of legacy systems. If you need to work on high density surface mount PCBs you should consider the GRS500 as a more suitable alternative.
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Multi-DUT Mobile & IoT Test System
IQxstream-M
Its ultra-compact design and flexible architecture makes it highly suitable for high volume manufacturing of smartphones, tablets and cellular IoT modules.
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Interoperability And Field Tests
Interoperability and field tests are carried out to determine the behavior of a device under test in a qualified test environment or in connection with specially selected, qualified products. Our interoperability and field tests are based on many years of experience with wireless technologies and our close cooperation with the leading manufacturers and network operators in the telecommunications industry.
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Universal ZIF (Zero-Insertion-Force) DIP Test Socket
Series X55X
Universal Zero Insertion Force DIP Test Socket. All pin count sockets go into PCB with either .300 or .600 [7.62 to 15.24] centers. Sockets can be soldered into PCBs or plugged into any socket. Socket fits into Aries or any competitive test socket receptacle.
